Design of High-speed ATE Calibration Equipment

• Abstract:

  The calibration of Automated Test Equipment(ATE) is an important part of microelectronics measurement. To achieve full calibration of high-speed ATE, each high-speed digital channel should be traced to the calibration equipment. Calibrating each channel individually with an instrument will pose a great challenge to the calibration of ATE, and channel switching will increase a large amount of calibration time. This paper puts forward a design solution of calibration equipment of high-speed ATE, which can realize the versatility and portability of calibration equipment, and realize multichannel automatic calibration progress.
• Download:

  IMEKO-TC4-2020-40.pdf
• DOI:

  _unreg_tc4-2020.40

Event details:

• IMEKO TC:

  TC4
• Event name:

  TC4 Symposium 2020 (ONLINE)
• Title:

  24^th IMEKO TC4 Symposium and 22^nd International Workshop on ADC and DAC Modelling and Testing (IWADC)

• Place:

  Palermo, ITALY
• Time:

  14 September 2020 - 16 September 2020