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DESIGN-FOR-TESTABILITY IN EMBEDDED MEASUREMENT SYSTEMS

Uwe Frühauf, Hellmut Leuterer
  • Abstract:
    Test and self-diagnosis are important for the reliability of embedded measurement systems. For such mixed-signal systems it was introduced any special methods of design-for-testability. This paper will discuss any problems of possible structures by using the analogue Boundary-Scan method and its implementation.
  • Keywords:
    design-for-testability, analogue Boundary-Scan, embedded mixed-signal systems
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  • DOI:
    _unreg_wc-2003.TC4-024

Event details:

  • IMEKO TC:
  • Event name:
    XVII IMEKO World Congress
  • Title:

    Metrology in the 3rd Millennium

  • Place:
    Dubrovnik, CROATIA
  • Time:
    22 June 2003 - 28 June 2003