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DEMONSTRATOR FOR RESOLUTION INCREASE AND AUTO-CORRECTION IN EMBEDDED MEASUREMENT SYSTEMS

U. Frühauf, E.-G. Kranz, H. Leuterer
  • Abstract:
    For investigation and training of students in the field of high resolution measurement technology was built an embedded measurement system with 16 bit resolution and additional modules for self-diagnostics and autocorrection, including a monitoring measurement system for evaluation.
  • Keywords:
    embedded measurement system, autocorrection, evaluation system
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  • DOI:
    _unreg_tc4-2002.035

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Conference and Workshop 2002
  • Title:
    4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    26 June 2002 - 28 June 2002