Skip to main content

Search Proceedings

COMPARATIVE ANALYSIS OF SURFACE ROUGHNESS MEASUREMENTS OBTAINED WITH THE USE OF CONTACT STYLUS PROFILOMETRY AND COHERENCE SCANNING INTERFEROMETRY

Stanisław Adamczak, Jacek Świderski, Stępień Krzysztof, Tomasz Dobrowolski, Ireneusz Piotr Chmielik
  • Abstract:
    The paper presents comparison of measurements of geometrical surface structure obtained by the contact stylus profilometer and an optical profilometer applying a coherence scanning interferometry method. The measurements were performed on type D1 roughness etalon.
  • Keywords:
    surface texture measurement, contact stylus scanning, coherence scanning interferometry
  • Download:
  • DOI:
    _unreg_wc-2015.316

Event details:

  • IMEKO TC:
  • Event name:
    XXI IMEKO World Congress
  • Title:

    Measurement in Research and Industry

  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    30 August 2015 - 04 September 2015