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CHARACTERISATION AND MODELLING OF THE ADC JITTER

P. Arpaia, P. Daponte, F. Maccaro, S. Rapuano
  • Abstract:
    The use of the Allan variance for the characterisation of the jitter error in analog-to-digital converters (ADCs) is proposed. In particular, the Allan variance is a sound basis for defining a figure of merit for jitter errors, diagnosing the jitter noise type, and including a jitter block into a previously proposed ADC model. Experimental results highlighting the effectiveness of the Allan variance in the characterisation of the ADC jitter error are discussed.
  • Keywords:
    jitter, A/D Converters, Allan variance
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  • DOI:
    _unreg_wc-2000.603

Event details:

  • IMEKO TC:
  • Event name:
    XVI IMEKO World Congress
  • Title:

    Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

  • Place:
    Vienna, AUSTRIA
  • Time:
    25 September 2000 - 28 September 2000