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CALIBRATION OF INSTRUMENT CURRENT TRANSFORMERS WITH ATYPICAL SECONDARY CURRENT

Renata Styblíková, Karel Draxler
  • Abstract:
    Methods enabling a determination of errors eI and dI for a high transformation ratio difference between a standard and tested instrument current transformers (ICT) are described in this article. A widespread method uses an automatic transformer test set for the measurement of a difference between a standard and tested ICT. A method transforming secondary currents to voltages and an indirect method using error measurement from magnetizing current are also described.
  • Keywords:
    current transformer, errors, lock-in amplifier
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  • DOI:
    _unreg_wc-2003.TC8-008

Event details:

  • IMEKO TC:
  • Event name:
    XVII IMEKO World Congress
  • Title:

    Metrology in the 3rd Millennium

  • Place:
    Dubrovnik, CROATIA
  • Time:
    22 June 2003 - 28 June 2003