AUTO-CORRECTION AND DESIGN-FOR-TESTABILITY IN EMBEDDED MEASUREMENT SYSTEMS

• Abstract:

  For investigation and training of students in the field of high resolution measurement technology was built an embedded measurement system with 16 bit resolution and additional modules for self-diagnostics and utocorrection, including methods of design-for-testability in analogue circuits.
• Keywords:

  Embedded measurement system, autocorrection, Design-for-testability, analogue Boundary-Scan, evaluation system
• Download:

  IMEKO-TC4-2002-120.pdf
• DOI:

  _unreg_tc4-symp-2002.120

Event details: