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AN OPTICAL CALIBRATION METHOD FOR A DOUBLE-SLIT INTERFEROMETER CAPABLE OF INSPECTING THICKNESS VARIATION OF MOVING GLASS PANELS

Chu-Shik Kang, Jong-Ahn Kim, Jae Wan Kim, Jonghan Jin
  • Abstract:
    A double-slit interferometer capable of inspecting thickness variation of a moving glass panel with nanometric resolution, and its calibration method using a partly electrode-coated nematic liquid crystal cell are presented.
  • Keywords:
    double-slit, interferometer, thickness variation, calibration, liquid crystal
  • DOI:
    _unreg_wc-2015.295

Event details:

  • IMEKO TC:
  • Event name:
    XXI IMEKO World Congress
  • Title:

    Measurement in Research and Industry

  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    30 August 2015 - 04 September 2015