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AN OPTICAL CALIBRATION METHOD FOR A DOUBLE-SLIT INTERFEROMETER CAPABLE OF INSPECTING THICKNESS VARIATION OF MOVING GLASS PANELS
Chu-Shik Kang, Jong-Ahn Kim, Jae Wan Kim, Jonghan Jin
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Abstract:A double-slit interferometer capable of inspecting thickness variation of a moving glass panel with nanometric resolution, and its calibration method using a partly electrode-coated nematic liquid crystal cell are presented.
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Keywords:double-slit, interferometer, thickness variation, calibration, liquid crystal
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Download:
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DOI:_unreg_wc-2015.295
Event details:
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IMEKO TC:
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Event name:XXI IMEKO World Congress
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Title:
Measurement in Research and Industry
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Place:Prague, CZECH REPUBLIC
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Time:30 August 2015 - 04 September 2015