AN IDEA OF AN APPROACH TO SELF-TESTING OF MIXED SIGNAL SYSTEMS BASED ON A QUADRATIC FUNCTION STIMULATION

• Abstract:

  A new approach to self-testing of the analog parts of mixed-signal electronic systems controlled by microcontrollers equipped with an ADC and a DAC is presented. It is based on a BIST and a new fault diagnosis method. A novelty is the use of the DAC as a component of the BIST, allowing to generate a stimulating signal with a quadratic function shape. It contributes to a better extraction of information about the state of the circuit under test.
• Keywords:

  microcontrollers, ADCs, DACs, self-testing, BISTs
• Download:

  IMEKO-WC-2015-TC4-109.pdf
• DOI:

  _unreg_wc-2015.109

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