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ADC Input Currents Measurement

Jakub Svatos, Jan Fischer, Jan Holub
  • Abstract:
    The contribution introduces the possible issue of internal CMOS Successive Approximation Register microcontroller's Analog-to-Digital Converters input currents. If the microcontroller also contains a multiplexer, it can lead to consequences caused by the sample-and-hold block that is part of a charge redistribution Analog-to-Digital Converter. The article presents its nature, the possibility of its measurement, and a simplified model of such an MCU analog inputs behavior. The simplified model and derived formulas can help the unacquainted user in a data acquisition system with the MCU design when measuring signal sources with non-negligible internal resistance. The introduced parameters, which cannot be found in datasheets, can be essential for users.
  • Keywords:
    ADC, Current, Measurement
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  • DOI:
    tc4-2023.07

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Symposium 2023
  • Title:

    26th IMEKO TC4 Symposium and 24th International Workshop on ADC and DAC Modelling and Testing (IWADC)

  • Place:
    Pordenone, ITALY
  • Time:
    20 September 2023 - 21 September 2023