Skip to main content

Search Proceedings

ADC HISTOGRAM TEST USING SMALL-AMPLITUDE INPUT WAVES

F. C. Alegria, P. Arpaia, P. Daponte, A. C. Serra
  • Abstract:
    The experimental investigation on a histogram test for analog-to-digital converters (ADCs) using as stimulus signals small-amplitude triangular waves superimposed to variable DC levels is presented. The test allows inexpensive triangular generators to be used and a dramatic reduction of the duration of the static test for the characterisation of high-resolution ADCs. The experimental comparison of the investigated test with a fullscale wave-based test and with the standard static test for different ADC architectures highlights its effectiveness.
  • Keywords:
    ADC testing, histogram method, triangular wave
  • Download:
  • DOI:
    _unreg_wc-2000.598

Event details:

  • IMEKO TC:
  • Event name:
    XVI IMEKO World Congress
  • Title:

    Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

  • Place:
    Vienna, AUSTRIA
  • Time:
    25 September 2000 - 28 September 2000