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ACTIVE BIAS NETWORK-BASED MEASUREMENT SET-UP FOR THE DIRECT CHARACTERIZATION OF LOW-FREQUENCY NOISE CURRENTS IN ELECTRON DEVICES

Corrado Florian, Pier Andrea Traverso
  • Abstract:
    A technology-independent set-up for the full and direct characterization of short-circuit low-frequency noise currents in two-port electron devices is presented. It is based on the use of low-noise transimpedance amplifiers and a specially-designed active bias network, adopted at the collector/drain port of the device. The features of the set-up proposed allow for a fast and accurate estimation of LF noise current power spectra, within a wide range of DC current bias levels, without the need for any reconfigurations and by carrying out a single-step procedure to achieve each bias point of interest.
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  • DOI:
    _unreg_tc4-2008.161

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
  • Title:
    XVIth IMEKO TC4 International Symposium on Electrical Measurements and Instrumentation (together with 13th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Florence, ITALY
  • Time:
    22 September 2008 - 24 September 2008