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A System for the Characterization of High Resolution DACs and ADCs

Umberto Pogliano
  • Abstract:
    This paper describes the system under construction at I.N.Ri.M. for the characterization of high resolution DACs and ADCs. The main measurement instrument used as a reference is a high precision sampling multimeter, which is properly configured for the measurement of both dc and ac voltages supplied by the DAC under test. A proper voltage pattern is supplied to the ADC under test by means of a multichannel output board put inside a computer, combined by suitable supplementary electronic circuits. The constructed signal is then measured by the multimeter and analyzed by the computer.
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  • DOI:
    _unreg_tc4-2005.100

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Workshop 2005
  • Title:

    10th IMEKO TC4 International Workshop on ADC Modelling and Testing - IWADC (together with XIVth IMEKO TC4 International Symposium on New Technologies in Measurement and Instrumentation)

  • Place:
    Gdynia/Jurata, POLAND
  • Time:
    12 September 2005 - 15 September 2005