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A STATE OF THE ART ON ADC MODELING

P. Arpaia, P. Daponte, S. Rapuano
  • Abstract:
    The state of the art of the research on modelling of analog-to-digital converter-based measuring devices is surveyed. Main topics of modelling are reviewed according to the fields of prevailing scientific interest in metrological research such as quantization models, error models, and correction-aimed models. In these fields, recent developments are analysed with the aim of focusing both the contemporary situation and the imminent trends.
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  • DOI:
    _unreg_tc4-2002.014

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Conference and Workshop 2002
  • Title:
    4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    26 June 2002 - 28 June 2002