A METHOD OF SELF-TESTING OF ANALOG CIRCUITS BASED ON FULLY DIFFERENTIAL OP-AMPS WITH TCBF CLASSIFIER

• Abstract:

  A new approach of self-testing of analog circuits based on fully differential op-amps of mixed-signal systems controlled by microcontrollers is presented. It consists of a measurement procedure and a fault diagnosis procedure. We measure voltage samples of a time response of a tested circuit on a stimulation of a unit step function given at the common-mode reference voltage input of the op-amp. The fault detection and fault localization is carried out by the TCBF neural network classifier.
• Keywords:

  neural classifiers, self-testing, microcontrollers, fully differential op-amps
• Download:

  IMEKO-WC-2015-TC4-110.pdf
• DOI:

  _unreg_wc-2015.110

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