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A Method of calibrating ATE while Test

Houping Zhou, Qin Zhang, Zhiwen Tang
  • Abstract:
    A method of calibrating the integrated circuit ATE (Automatic Test Equipment) by synchronizing and measuring the signal on the DUT(Device Under Test) side while test is presented. This method connects the measuring instruments to the pin of the DUT while calibration. The computer controls the measuring instrument to capture the changes and values of the voltage and current on each pin of the DUT during the test. The specifications of the ATE can be calculated though the measured data.Therefore ,the ATE is calibrated via compare it’s primitive specifications and the measured one.
  • Keywords:
    calibration, ATE, test
  • Download:
  • DOI:
    _unreg_tc4-2019.054

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Symposium 2019
  • Title:

    23rd IMEKO TC4 Symposium

  • Place:
    Xi'an, CHINA
  • Time:
    17 September 2019 - 20 September 2019