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A method for minimum node selection in diagnostics of analog systems

Adrian Bilski, Jacek Wojciechowski
  • Abstract:
    The aim of this work is to introduce a strategy for finding minimal set of test nodes for diagnostics of complex analog systems with single parametric faults, using SVM classifier as a fault locator. The results of diagnostics of a low-pass filter using taboo search and GA algorithms as node selectors in conjunction with SVM fault classifier are presented.
  • Keywords:
    complex analog systems, support vector machine, taboo search, genetic algorithm, parametric fault detection
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  • DOI:
    _unreg_tc10-2014.014

Event details:

  • IMEKO TC:
    TC10
  • Event name:
    TC10 Workshop on Technical Diagnostics 2014
  • Title:

    13th IMEKO TC10 Workshop "Advanced measurement tools in technical diagnostics for systems' reliability and safety"

  • Place:
    Warsaw, POLAND
  • Time:
    26 June 2014 - 27 June 2014