A CS method for DAC nonlinearity testing

• Abstract:

  High resolution Digital-to-Analog Converters (DACs) are known to be characterized by static testing procedures with a remarkable duration, due to the huge number of employed codes. This paper proposes a method that allows to reconstruct the Integral Non-Linearity through the Compressed Sensing, by measuring the DAC output on a reduced number of codes. The proposed reduced-code test is evaluated for several compression ratios, turning out well performing in terms of Root Mean Square Error.
• Download:

  IMEKO-TC4-2020-28.pdf
• DOI:

  _unreg_tc4-2020.28

Event details:

• IMEKO TC:

  TC4
• Event name:

  TC4 Symposium 2020 (ONLINE)
• Title:

  24^th IMEKO TC4 Symposium and 22^nd International Workshop on ADC and DAC Modelling and Testing (IWADC)

• Place:

  Palermo, ITALY
• Time:

  14 September 2020 - 16 September 2020