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A BUILT-IN SELF-CHECK METHOD FOR MULTI-CHANNEL MEASUREMENT SYSTEMS

Vadim Geurkov
  • Abstract:
    Signature analysis techniques have become extremely popular in digital systems testing due to such advantages as simplicity, small amount of additional circuitry, and small degree of error masking. In this paper the signature analysis techniques are applied to mixed (analog-to-digital) systems testing. The general case of multi-channel measurement system is considered.
  • Keywords:
    BIST, ADC, signature analysis
  • Download:
  • DOI:
    _unreg_tc4-2002.032

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    TC4 Conference and Workshop 2002
  • Title:
    4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
  • Place:
    Prague, CZECH REPUBLIC
  • Time:
    26 June 2002 - 28 June 2002