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UNCERTAINTY EVALUATION IN DITHERED A/D CONVERTERS

Filippo Attivissimo, Nicola Giaquinto, Mario Savino
  • Abstract:
    In this paper formulae for evaluating the uncertainty of measurements (direct and indirect) performed by means of an ADC-based device are presented. The complex technique of dithering is used to reduce the effect of noise and to increase the ADC resolution. The authors discuss a way of writing and interpreting the uncertainty specifications of ADCs.
  • Keywords:
    uncertainty, measurement error, A/D converters
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  • DOI:
    _unreg_tc7-2004.017

Event details:

  • IMEKO TC:
    TC7
  • Event name:
    TC7 Symposium 2004
  • Title:

    10th Symposium on Advances of Measurement Science

  • Place:
    St. Petersburg, RUSSIA
  • Time:
    30 June 2004 - 2 July 2004