SYSTEM FOR DYNAMIC TESTING OF ANALOG TO DIGITAL MODULES

• Abstract:

  An automated system for dynamic testing of ISA, PCI and VXI modules in frequency range up to 1 MHz developed at Department of Measurement of FEE CTU Prague is presented. The application of the Hewlett-Packard E1430A high precision VXIbus digitizer for evaluation of testing signals is described.
• Keywords:

  AD modules dynamic testing, test system, VXI bus
• Download:

  IMEKO-WC-2000-EWADC-P640.pdf
• DOI:

  _unreg_wc-2000.640

Event details:

• IMEKO TC:
• Event name:

  XVI IMEKO World Congress
• Title:

  Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

• Place:

  Vienna, AUSTRIA
• Time:

  25 September 2000 - 28 September 2000