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Statistical Performance of Gaussian ADC Histogram Test

A. Moschitta, P. Carbone, D. Petri
  • Abstract:
    In this paper, the statistical properties of the Gaussian Histogram Test (GHT) are theoretically evaluated and compared to the corresponding Cramér-Rao Lower Bound (CRLB). In particular, it is shown that the GHT is asymptotically unbiased and efficient. Finally, the GHT is compared to the Sinewave Histogram Test (SHT) one.
  • Keywords:
    Gaussian Histogram Test, Sinewave Histogram Test, Cramér-Rao Lower Bound
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  • DOI:
    _unreg_iwadc-2003.52

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    IWADC 2003
  • Title:

    VIIIth IMEKO TC4 Workshop on ADC modelling and testing

  • Place:
    Perugia, ITALY
  • Time:
    8 September 2003 - 10 September 2003