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PRECISION WAVELENGTH METROLOGY WITH A FOURIER TRANSFORM SPECTROMETER

Damir Veza, Marc L. Salit, John C. Travis, Craig J. Sansonetti
  • Abstract:
    We have investigated the intrinsic accuracy of the optical frequency scale in spectra acquired by a Fourier Transform Spectrometer (FTS). The uncalibrated accuracy of the FTS optical frequency axis is about 1 part in 105. This uncertainty can be reduced by at least two orders of magnitude using a multiplicative calibration correction derived from a single wavelength standard line. The work reported here describes a new approach to accurate calibration of the wavenumber scale for a UV-visible FTS, which we have used to measure accurate wavenumbers and Ar pressure shifts for the prominent lines of 198Hg.
  • Keywords:
    Fourier Transform Spectrometer, wavenumber calibraton, Hg, pressure shift
  • DOI:
    _unreg_wc-2003.TC2-016

Event details:

  • IMEKO TC:
  • Event name:
    XVII IMEKO World Congress
  • Title:

    Metrology in the 3rd Millennium

  • Place:
    Dubrovnik, CROATIA
  • Time:
    22 June 2003 - 28 June 2003