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Fault detection in complex analog circuits using Support Vector Machines

Adrian Bilski, Jacek Wojciechowski
  • Abstract:
    The aim of this paper is to bring the reader closer to the diagnostics of complex analog systems with parametric faults, using Support Vector Machine (SVM) as a tool for fault location. The results of diagnostics of a video enhancer and two low-pass filters with the help of SVM network are presented, and various SVM kernel functions tested. A strategy for finding the optimal kernels and their parameters for the particular system under test is proposed. This paper is focused on linear systems diagnostics.
  • Keywords:
    Complex analog systems, Support Vector Machine, parametric fault detection
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  • DOI:
    _unreg_tc10-2013.008

Event details:

  • IMEKO TC:
    TC10
  • Event name:
    TC10 Workshop 2013
  • Title:

    12th IMEKO TC10 Workshop "New Perspectives in Measurements, Tools and Techniques for Industrial Applications"

  • Place:
    Florence, ITALY
  • Time:
    6 June 2013 - 7 June 2013