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Automatic Generation of LH-BIST Architecture for ADC Testing

S. Bernard, F. Azaïs, M. Comte, Y. Bertrand, M. Renovell
  • Abstract:
    No generic BIST architecture exists for Analog-to-Digital Converters testing. For each application and test setup we thus have to build a dedicated BIST architecture. In this paper, we show that the LH-BIST architectures based on the Linear Histogram-based test technique are configurable and we evaluate hardware resources according to any given application. We also propose a software tool allowing the automatic generation of the LH-BIST description.
  • Keywords:
    ADC testing, Histogram-based test, BIST, configurable BIST architecture
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  • DOI:
    _unreg_iwadc-2003.03

Event details:

  • IMEKO TC:
    TC4
  • Event name:
    IWADC 2003
  • Title:

    VIIIth IMEKO TC4 Workshop on ADC modelling and testing

  • Place:
    Perugia, ITALY
  • Time:
    8 September 2003 - 10 September 2003