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A Frequency-Domain Approach to ADC Phase-Plane Modeling and Testing
Conceição Líbano Monteiro, Pasquale Arpaia, António Cruz Serra
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Abstract:An alternative spectrum-based approach for determining the phase-plane error of an analog-to-digital converter is proposed. The method exploits a phase-plane error modeling, based on a dual-tone input stimulus and an output spectrum analysis [1]-[2]. In this way, the amount of data required by the dual-tone histogram test [3] is reduced.
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Keywords:Analog-to-digital converters, dynamic testing, nonlinearity, phase plane, frequency domain test, dual tone
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Download:
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DOI:_unreg_iwadc-2003.42
Event details:
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IMEKO TC:TC4
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Event name:IWADC 2003
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Title:
VIIIth IMEKO TC4 Workshop on ADC modelling and testing
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Place:Perugia, ITALY
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Time:8 September 2003 - 10 September 2003