Linearization of A/D converters using dither
Abstract
In this paper a novel approach to A/D conversion is introduced. After significant oversampling data points can be selected of which we precisely know the value – these are the samples at transition level crosses. The levels are determined beforehand using histogram testing. To have sufficient number of transition level crosses, dither can be added. Finally, to obtain uniformly sampled data, interpolation is performed. Using this method, the error of AD conversion can be significantly reduced still using the same low-bit converter.
Event details
- Event
- TC4 Symposium 2013
- Technical Committee
- TC4
- joaquin.del.rio@upc.edu
- Place
- Barcelona, SPAIN
- Time
- 18 July 2013 - 19 July 2013
- Website
- http://www.imeko2013.es/